About

Modern Electronic Materials (MOEM) publishes original experimental and theoretical research on electronic and functional materials, their synthesis, structure, physical properties, characterization, modeling, processing, integration, stability, and applications in modern electronic, photonic, sensing, and energy-conversion technologies.

The journal particularly welcomes studies that establish clear relationships between material composition, structure, processing, physical mechanisms, functional properties, and device-relevant performance, as well as interdisciplinary research combining materials science, solid-state physics, electronics, and advanced characterization.

The scope of Modern Electronic Materials (MOEM) includes, but is not limited to, the following subject areas:

1. Semiconductor Materials and Single Crystals
   Elemental and compound semiconductors; wide- and narrow-bandgap materials; doping; intrinsic and impurity-related defects; phase and chemical composition; electrical, optical, and transport properties; growth of bulk single crystals.

2. Thin Films, Epitaxial Layers, and Heterostructures
   Epitaxial growth and thin-film deposition; superlattices; heterojunctions; multilayer structures; two-dimensional electron systems; stresses and defects in films; heterogeneous materials integration.

3. Dielectric, Ferroelectric, and Piezoelectric Materials
   Dielectrics; ferroelectric and antiferroelectric materials; piezoelectrics; pyroelectrics; electrets; domain structures and domain walls; electro-optic and acousto-optic materials; polarization and electromechanical properties.

4. Magnetic, Magnetoresistive, and Spintronic Materials
   Ferromagnetic, ferrimagnetic, and antiferromagnetic materials; magnetic thin films and nanostructures; spintronics; magnetoresistive effects; magneto-optics; magnetic anisotropy; domain structures; magnetization reversal.

5. Multiferroic and Magnetoelectric Materials
   Single-phase multiferroics; magnetoelectric composites and multilayer structures; coupling among electrical, magnetic, and mechanical subsystems; materials for sensors, energy converters, and self-biased devices.

6. Multilayer, Composite, and Hybrid Materials
   Ceramic, polymer, and crystalline composites; functional coatings; layered structures; hybrid organic–inorganic systems; integration of materials with different functional properties.

7. Surfaces, Interfaces, and Defects
   Surface states; phase, grain, and contact boundaries; domain walls; adhesion; diffusion and segregation; structural and point defects; effects of surfaces, interfaces, and defects on materials functionality.

8. Nanomaterials and Low-Dimensional Structures
   Nanocrystals; quantum dots, wires, and wells; two-dimensional materials; nanoparticles; nanoporous systems; quantum confinement; size effects; synthesis, structure, and properties of low-dimensional functional materials.

9. Amorphous, Organic, and Flexible Electronic Materials
   Amorphous semiconductors; organic semiconductors; conducting polymers; molecular electronics; flexible and printed electronics; organic and hybrid thin-film structures.

10. Optoelectronic and Photonic Materials
    Light-emitting and photosensitive materials; phosphors; laser media; nonlinear optical materials; photonic structures; materials for photodetectors, light-emitting diodes, modulators, and integrated photonics.

11. Thermoelectric Materials and Devices
    Bulk, thin-film, and low-dimensional thermoelectrics; Seebeck and Peltier effects; electronic and phonon transport; thermal-conductivity engineering; enhancement of thermoelectric figure of merit; thermoelectric generators, coolers, and sensors.

12. Perovskite Materials for Photovoltaics and Optoelectronics
    Halide perovskites, perovskite-inspired, and lead-free materials; absorber, transport, and contact layers; interfaces; stability and degradation; tandem solar cells; perovskite-based photodetectors and light-emitting diodes.

13. Characterization and Diagnostics of Electronic Materials
    Structural, phase, chemical, elemental, morphological, and local characterization of electronic materials and functional structures; X-ray diffraction and scattering (XRD, XRR, RSM, SAXS/WAXS); secondary ion mass spectrometry (SIMS); photoelectron and Auger electron spectroscopy (XPS, UPS, AES); transmission, scanning transmission, and scanning electron microscopy (TEM, STEM, SEM); electron diffraction and microanalysis; scanning probe microscopy; Raman, infrared, and optical spectroscopy; ellipsometry; layer-resolved analysis and depth profiling; development and application of in situ and operando methods.

14. Electronic Structure Calculations and Modeling of Materials and Technological Processes
    First-principles calculations and density functional theory; band structure; density of states; phonon spectra; defects, surfaces, and interfaces; calculation of optical, thermal, and transport properties; molecular dynamics and high-throughput materials discovery; modeling of heat and mass transfer, fluid flow, phase formation, bulk-crystal and epitaxial-layer growth, and temperature and impurity distributions.

15. Advanced Methods for Materials Synthesis, Processing, and Activation
    Plasma, laser, ion-beam, electron-beam, microwave, and mechanochemical processing; nonequilibrium processes; surface modification; localized control of structure and properties; advanced and combined methods for producing electronic materials.

16. Stability, Degradation, and Reliability of Electronic Materials
    Thermal, electrical, mechanical, chemical, and radiation resistance; aging; electromigration; degradation of surfaces and interfaces; cyclic loading; long-term stability of the functional properties of materials and structures.

The journal welcomes interdisciplinary studies spanning several of these subject areas when the principal scientific contribution is related to electronic or functional materials.

All submitted manuscripts undergo an initial editorial assessment for compliance with the journal's scope, scientific quality, originality, publication ethics and formal requirements.

Manuscripts that do not meet these criteria may be rejected before external peer review or returned to the authors for technical or linguistic revision.

Manuscripts that pass the initial assessment are normally evaluated by at least two independent experts.

MOEM uses a single-blind peer-review model: reviewers have access to the authors' identities, while reviewers remain anonymous to the authors.

Reviewers assess manuscripts primarily with regard to:

• originality and scientific significance;
• methodological soundness;
• quality and reproducibility of the experimental or theoretical approach;
• adequacy of the presented evidence;
• validity of data analysis and conclusions;
• appropriate consideration of previous research;
• clarity and logical presentation;
• relevance to the scope of MOEM.

The reviewer recommendation options used by the journal are:

Accept / Major Revision / Minor Revision / Reject.

The editor handling the manuscript evaluates the reviews, the authors' responses and the scientific content of the manuscript and makes the decision on publication.

In disputed or exceptional cases, as well as in cases requiring reconsideration of an editorial decision, the Editor-in-Chief has final authority.

Detailed instructions for reviewers and the step-by-step review procedure are provided separately in the Reviewer Guidelines.

MOEM follows internationally recognized principles of publication ethics and the recommendations of the Committee on Publication Ethics (COPE).

Manuscripts submitted to MOEM must be original, must not have been published previously in substantially the same form, and must not be simultaneously under consideration by another journal.

Authors are responsible for:

• the integrity and accuracy of the reported results;
• appropriate citation and attribution of previous work;
• correct authorship and acknowledgement of individual contributions;
• disclosure of funding and conflicts of interest;
• obtaining necessary permissions for copyrighted material;
• informing the Editorial Office of significant errors identified after submission or publication.

Plagiarism, duplicate publication, fabrication or falsification of data, inappropriate manipulation of research results and other forms of research misconduct are not acceptable.

Editors and reviewers must disclose relevant conflicts of interest and preserve the confidentiality of unpublished manuscripts.

Suspected misconduct, corrections, expressions of concern and retractions are handled in accordance with applicable COPE recommendations.

For research involving humans, human-derived materials or animals, where applicable, authors must confirm compliance with relevant institutional, national and international ethical requirements and provide information on the required approvals and informed consent.

Artificial intelligence tools may be used by authors, reviewers and editors as supporting tools, but they cannot replace human scientific judgement, authorship, peer review or editorial responsibility.

Authors must disclose substantial use of generative AI or similar tools in manuscript preparation where such use is relevant to the scientific or textual content of the article.

Editors may use AI-assisted tools to support preliminary manuscript assessment, literature analysis, language assessment and organization of editorial analysis. Reviewers may use AI-assisted tools to support their evaluation of a manuscript.

However, the substance of an editorial assessment, peer-review report or publication decision must be produced and verified by a human expert. Editors and reviewers remain fully responsible for their conclusions and decisions.

The use of AI tools must comply with applicable confidentiality and data-protection requirements for unpublished manuscripts and editorial correspondence.

AI-assisted tools may also be used during translation and language editing. The final English-language version must be checked and approved before publication, and responsibility for the published text remains with the authors and the journal.

Manuscripts may be submitted in grammatically and stylistically appropriate English or Russian.

All articles in MOEM are published in English.

Authors submitting a manuscript in Russian are not required to provide an English translation at the initial submission or peer-review stages.

After a Russian-language manuscript has been accepted for publication, it is translated into English. Translation is a paid publication service and is charged separately from the Article Processing Charge.

MOEM provides immediate open access to all published content.

Copyright remains with the authors. Authors grant NUST MISIS the right to publish the article and identify itself as the original publisher.

Articles and supplementary materials are distributed under the License Creative Commons Attribution License (CC BY NC ND 4.0).

Under CC BY 4.0, published material may be shared and adapted for any lawful purpose, provided that appropriate credit is given to the original authors and source.

An Article Processing Charge (APC) is applied only to manuscripts accepted for publication.

The standard APC is:

The APC covers editorial, production, and other publication-related expenses. It does not include translation of manuscripts submitted in Russian. The APC is payable under an agreement concluded after the manuscript has been accepted for publication. The agreement may be concluded with either an individual or a legal entity.

Translation of Russian-Language Manuscripts

For accepted manuscripts submitted in Russian, the following additional translation fee applies:

For calculation of the translation fee, manuscript length is determined by the total number of characters including spaces in the Russian-language manuscript. The abstract, keywords, main text, table text, and figure captions are included in the character count. Text contained within figures is excluded.

Translation charges are separate from the APC and are not reduced by standard APC discounts unless an exception is explicitly approved by the journal.

APC Discounts and Waivers

The journal applies the following reduced APCs:

Student or postgraduate status must be confirmed upon request.

Standard author-category discounts are not cumulative. Where an article qualifies for more than one category, the highest applicable discount is used.

Translation fees are calculated separately.

MOEM recognizes the contribution of active peer reviewers through an APC incentive programme.

Completed peer reviews performed for MOEM within the preceding 36 months may be accumulated toward an APC discount:

Reviewer incentives apply to the APC and do not automatically cover translation charges.

A reviewer may use the earned benefit for an eligible publication in MOEM in accordance with the journal's reviewer incentive rules. A maximum of one full APC waiver per reviewer per year may be granted through the programme.

The detailed rules for accumulation, transfer and use of reviewer benefits are provided separately in the journal's APC and Reviewer policies.

Personal information collected through the journal website and editorial system is used only for purposes related to manuscript submission, peer review, editorial processing, publication and communication associated with the journal.

Personal data are handled in accordance with applicable data-protection requirements and the privacy policy of the journal's publishing platform.